Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].

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Digital circuit testing and testability (Book, ) []

Test Generation for Sequential Circuits. Joseph Kumar rated it liked it Jan anx, Please create a new list with a new name; move some items to a new or existing list; or delete some items. There are no discussion topics on this pagag yet. WorldCat is the world’s largest library catalog, helping you find library materials online.

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Digital circuit testing and testability

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Digital Circuit Testing and Testability by Parag K. Lala

Please enter the message. Please enter your name. Parag K Lala Find more information about: In the past few years, reliable hardware system design has become increasingly important in the computer industry.

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Digital Circuit Testing and Testability

You can now embed Open Library books on your website! Reliability is one of the most important considerations in computer design, and an important part of creating a computer is designing one that circhit tolerant of faults.

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